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- 1974 |
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- 1976¡1981 - 2005 ¡ÇöÀç - 2006¡ÇöÀç |
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-Jongmin Lim, Hyunah Park, Chongmu Lee, 'Enhancement of Ru nucleation by pretreatments of the underlying TaSiN film surface in Ru MOCVD", Thin Solid Films 475 (2005) pp. 194-197. -Dukryel Kwon, Hyunah Park, Chongmu Lee, "Electromigration resistance-related microstructural change with rapid thermal annealing of electroplated copper films", Thin Solid Films 475 (2005) pp. 58-62. -Chongmu Lee, Jongmin Lim, "Dependence of the electrical properties of the ZnO thin films grown by ALE on the reactant feed sequence", J. Vac. Sci. Technol. A24 (2006). ¿Ü 296Æí
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- ±Ý¼Ó ¹× À¯Àüü ¹Ú¸·, , 1996. - ¹ÝµµÃ¼ °øÁ¤±â¼ú, , 1994. - ¹ÝµµÃ¼ ½Ç¹« °£ºÎ °úÁ¤, , 1993. - °øÁ¤ ±â¼ú ÀÌ·Ð, , 1990. - Submicron¼ÒÀÚ Á¦Á¶¸¦ À§ÇÑ °øÁ¤±â¼ú(¥°), , 1987. - Submicron¼ÒÀÚ Á¦Á¶¸¦ À§ÇÑ °øÁ¤±â¼ú(¥±), , 1987. |
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- ¸¶±×³×Æ®·Ð ½ºÆÛÅ͸µ¹ýÀ» ÀÌ¿ëÇÑ ±Ý¼ÓÀÌ µµÇÎµÈ ZnO ¹Ú¸·ÀÇ Á¦Á¶¹æ¹ý, 2005 - ¿øÀÚÃþ ÁõÂø¹ý¿¡ ÀÇÇÑ pÇü »êȾƿ¬ ¹Ú¸·ÀÇ Á¦Á¶ ¹æ¹ý, 2005 - »êȾƿ¬ ¹Ú¸·ÀÇ ÈĿó¸® °øÁ¤¿¡¼ÀÇ ºÐÀ§±â Á¦¾î ¹æ¹ý, 2005
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- 1992 Çѱ¹Àü±âÀüÀÚÀç·áÇÐȸ ³í¹®»ó - 1994 Çѱ¹Àç·áÇÐȸ Çмú»ó - 1999 ÀÎÇÏ°ø´ë Çмú»ó - 2001 ÀÎÇÏ´ëÇб³ ¿ì¼ö¿¬±¸´ë»ó - 2001 Áß¼Ò±â¾÷ ±â¼úÇõ½Å ´ëÀü - ´ëÅë·É ÈÆÀå (±ÙÁ¤Æ÷Àå)¼ö»ó - 2002 Á¦12ȸ °úÇбâ¼ú¿ì¼ö³í¹®»ó - 2004 ÀÎÇÏ¿¬±¸´ë»ó - 2005 ÀÎÇÏÆç·Î¿ì±³¼ö(IFP) |